LCR | Resistance | Battery Testers

LCR Testing in Research and Development

C METER 3506-10   LCR METER IM3533, IM3533-01   EQUIVALENT CIRCUIT ANALYSIS
FIRMWARE IM9000
  IMPEDANCE ANALYZER IM3570

• |Z|, L, C, R, σ, ε testing
• Battery measurement
• 1 mHz to 200 kHz
• 2 ms measurement time
   
• |Z|, L, C, R testing
• 1 mHz to 200 kHz
• 2 ms measurement time
• Transformer mode
• Frequency sweep w/IM3533-01       
   
• Optional software for Model IM3570
• 5 equivalent circuit models
• Plot frequency characteristics graph
  from analysis results
• Cole-Cole plot, admittance circle
  display
  
• |Z|, L, C, R testing
• 4 Hz to 5 MHz
• 0.5 ms measurement time
• Measure LCR and conduct frequency
  sweeps simultaneously
     
LCR HiTESTER 3535   LCR HiTESTER 3535

• |Z|, L, C, R testing
• 100kHz to 120MHz
• 6 ms measurement time
    

• |Z|, L, C, R testing
• 42Hz to 5MHz
• 5 ms measurement time


LCR and Capacitance Testing During Component Production

C METER 3506-10   LCR METER IM3523   C HiTESTER 3504 Series   LCR HiTESTER 3511-50

• C, D (tan δ), Q, and
  low capacitance testing
• 1 kHz, 1 MHz
• 1.5 ms measurement time at 1 MHz
      
• |Z|, L, C, R testing
• 40 Hz to 200 kHz
• 2 ms measurement time        
  
• C, D (tan δ), high capacitance
  MLCC testing
• 120Hz or 1kHz
• 2 ms measurement time
      
• |Z|, L, C, R testing
• 120Hz or 1kHz
• 5 ms measurement time


DC Resistance Testing

RESISTANCE METER RM3545 Series   RESISTANCE METER RM3544 Series   RESISTANCE METER RM3548   RESISTANCE HiTESTER RM3543 Series

• For coil or line resistance to
  high resistance measurements
• DC, 1 A max. testing source
• 2.2ms measurement speed
• 0.01 μΩ resolution
  
• For both manual operation and
  integration with automatic lines
• DC, 300 mA max. testing source
• 18 ms measurement speed
• 1 μΩ resolution       
   
• Portable resistance meter
  measures from µΩ to MΩ
• DC, 1 A max. testing source
• Approx. 100 ms refresh rate
• 0.1 μΩ resolution
 
• For automated lines
• DC testing source
• 0.1 ms integration time
• 0.01 μΩ resolution
 
     
RESISTANCE HiTESTER RM3542 Series   RESISTANCE HiTESTER 3541

• Ideal for high-speed automated    
  lines
• DC testing source
• 0.9 ms measurement time
• 0.1 ms integration time
• 0.1 μΩ resolution
 
• For coil or line to high
  resistance measurements
• DC testing source
• Fastest response time less than 2ms
• 0.6 ms ±0.3 ms sampling
• 0.1 μΩ resolution


Leak Current

DIGITAL PRINTER 9203

• Prints out measurement data at fixed intervals
• For Model 3540-02, 3560, 3550, 3551, 3227


Battery Testing

BATTERY HiTESTER BT3562 Series   BATTERY HiTESTER BT3563 Series   BATTERY HiTESTER 3554   BATTERY HiTESTER 3561 Series

• Production line testing of
  high voltage battery packs up to 60V
• AC 1kHz testing source 
• 10ms measurement time
• 0.1µΩ and 10µV resolution
  
• Production line testing of
  high-voltage battery packs
  up to 300V
• AC 1kHz testing source
• 10ms measurement time
• 0.1µΩ and 10µV resolution     
 
• For regular maintenance of UPS
  and lead-acid batteries up to 60V
• AC 1kHz testing source
• 1µΩ resolution
 

• For regular maintenance
  of UPS and lead-acid
  batteries up to 60V
• AC 1kHz testing source
• 1µΩ resolution
 
     
BATTERY HiTESTER 3555    

• For regular maintenance of
  compact storage batteries up to 30V
• AC 1kHz testing source
• 100µΩ resolution